Specifications & ordering info
|Product||Geometrical resolution||Measuring range length||Relative linearity deflection||Sensing distance||Sensing distance (min.)||Sensing method||Spot size||Height of sensor||Width sensor||Overall length||Description|
|0.005 mm||65-135 mm||0.1 %||100 mm||65 mm||Diffuse reflective||0.1 mm||47.5 mm||22.6 mm||35.5 mm||Laser displacement sensor, CMOS type, sensor head, spot beam type, 100mm +/-35mm, 5µm resolution, 0.5m cable|
|0.005 mm||65-135 mm||0.05 %||100 mm||65 mm||Diffuse reflective||2.7 mm x 0.1 mm||47.5 mm||22.6 mm||35.5 mm||Laser displacement sensor, CMOS type, sensor head, line beam type, 100mm +/-35mm, 5µm resolution, 0.5m cable|
|0.0015 mm||40-60 mm||0.1 %||50 mm||40 mm||Diffuse reflective||60 µm||47.5 mm||22.6 mm||35.5 mm||Laser displacement sensor, CMOS type, sensor head, spot beam type, 50mm +/-10mm, 1.5µm resolution, 0.5m cable|
|0.0015 mm||40-60 mm||0.05 %||50 mm||40 mm||Diffuse reflective||2.6 mm x 60 µm||47.5 mm||22.6 mm||35.5 mm||Laser displacement sensor, CMOS type, sensor head, line beam type, 50mm +/-10mm, 1.5µm resolution, 0.5m cable|
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HSDR-CMOS Image sensor
The ZX2 utilizes a newly developed High Speed & Dynamic Range (HSDR) CMOS image sensor. This provides stable measurement on surfaces ranging from highly absorbing to highly reflective, without loss of accuracy. The ZX2 continually monitors the received light level and adjusts the laser diode output to compensate, all in a cycle time of 60μs.
ZX2 Easy Set-up The ZX2 eliminates the need for complex set-up through lengthy parameter adjustment. A smart button is used to configure the sensor by defining the surface type for measurement.
- One type of surface
- Multiple surface types
- Highly reflective surfaces
Double sheet detection application
The high accuracy measurement and ability to cope with varying surface types, allows the ZX2 to be used for double sheet inspection.
Position reference application
Accurate linear measurements can be performed at high speed, allowing the ZX2 to be used for high speed position reference applications.
Thickness measurement application
Thickness measurement is made simple in the ZX2 via the calculation unit. Accurate thickness measurements can be achieved even on highly reflective surfaces.
Using multiple ZX2 units it is possible to inspect the warpage or deflection of components. Even where the temperature or measurement surface varies, stable measurements can still be achieved.